Technical Data:
Series: 178
Detector measuring force: 0.75 mN
X-axis range: 50 mm
Z1 detector ranges: 800 um, 80 um, 8 um
X-axis resolution: 0.05 um
Z1 resolution: 0.01 um (800 um); 0.001 um (80 um); 0.0001 um (8 um)
Applicable standards: JIS 1982 / 1994 / 2001; ISO 1997; ANSI; VDA
Assessed profiles include Primary, Roughness, Waviness, Filtered waviness, Rolling circle waviness, Rolling circle center line waviness, Envelope residual, DIN4776, Roughness motif, Waviness motif

Application:
PC data-processing surface roughness tester.