Technical Data:
Series: 525
X-axis range: 200 mm
Z1 range: 16 mm (+/-8 mm horizontal)
Straightness: 0.6 um / 200 mm
X accuracy at 20 degC: (0.8+0.015L) um
Z1 accuracy: +/-(0.5+|2H|/100) um
Detector: Arc scale (RT-10 um)
Measuring force: 0.75 mN
Standard stylus: 2 um radius, 60 deg, diamond
Cone stylus: 25 um radius, 30 deg, sapphire
Stroke limit specified -7 to +7 mm; positioning accuracy range +/-1 mm
X-axis inclination: +/-45 deg
Z2 travel shown: -
Base: Granite

Application:
Simultaneous contour and surface roughness measurement.

Dimensions:
Base size: 1000 x 450 mm